<?xml-stylesheet type="text/xsl" href="https://emersonexchange365.com/cfs-file/__key/system/syndication/rss.xsl" media="screen"?><rss version="2.0" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/" xmlns:wfw="http://wellformedweb.org/CommentAPI/"><channel><title>IIoT and MultiVariable Instrumentation</title><link>/iiot-digital-transformation/b/weblog/posts/iiot-and-multivariable-instrumentation</link><description>Connor Oberle 
 When you hear discussions about “the cloud” you often also hear about “the edge” where higher resolution processing can be performed. For manufacturers and producers, this edge may extend to the instrumentation itself measuring and controlling</description><dc:language>en-US</dc:language><generator>Telligent Community 13</generator></channel></rss>